麻烦求一篇文章,谢谢

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lingtingsnow
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Journal of Microscopy, 2014 Sep;255(3):180-7.

Use of permanent marker to deposit a protection layer against FIB damage in TEM specimen preparation

Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang

DOI: 10.1111/jmi.12150

e-mail: [email protected]
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lingtingsnow

文章已经求到,再次感谢那位热心朋友。

【 在 lingtingsnow (lingling) 的大作中提到: 】
: Journal of Microscopy, 2014 Sep;255(3):180-7.
:
: Use of permanent marker to deposit a protection layer against FIB damage
in
: TEM specimen preparation
: Y C Park 1 , B C Park, S Romankov, K J Park, J H Yoo, Y B Lee, J-M Yang
: DOI: 10.1111/jmi.12150
: e-mail: [email protected]